(1) Displayer
1. A 7-inch TFT colored touch screen
2. Available to support the protection of stop condition for over stroke, over capacity and over time.
3. Chinese, English, Japanese, available
4. Force, stress, torque, displacement, time are indicated
5. Test setting: Test speed, direction, automatic return, machine stop at break
6. Data analysis: Maximum force, interval force, force at break, etc.
7. Protection from excessive test stroke, capacity and time
8. Up to 50 data can be saved by USB
9. It can be restored to factory settings.
10.It can be calibrated in stand-alone mode
11.Metric/imperial units adjustable
12.Supports various signals

(2) Extensometer

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QC-557 Short extensometer Suitable for elongation below 50% |
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QC-551 Long travel extensometer Suitable for samples with over 20% elongation
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1. Data sample rate faster can be set up to 400Hz
2. Operation method: By keyboard and mouse control test, can also through up and down button to adjust the fixture position
3. Compatible with Window 7 /8 /10 system
4. Software has multi-languages with Chinese, English, Japanese, Korean, Spanish and Polish display.
5. Operating mode: TCP/IP interface, two-way transmission, the computer directly control the machine action
6. Can import multiple test data display simultaneously
7. Unit selection can be Metric unit and Imperial units.
8. Form flexibility, self-planning information analysis .
9. Data name can be self-set and can self-defined formula
10. Test Screen can be selected data display, graphic display or simultaneous display.
11. Data processing: store, call, list, statistical comparison, etc..
12. Graph X-Y axis physical quantity adjustment, graph-specific mark, interval mark, slope and son on.
13. Test tensile, compression, bending, peeling, spring and other tests.
14. Software protection: Overload, over -displacement, over-time protection.
15. Variety of test actions, Ex. hold tensile (compression), 10 grades of the actions.
16. Modularization of specimen setting, providing easy to set specimen.
17. Modularization of test conditions to reduce artificial setting negligence and error.
18. Key data capture, can set the upper and lower limits of test data specifications.
19. Support multiple sets of I / O signals, increase testing mechanism.